JEM-F200
类别
TEM概述
The JEM-F200 (F2) Multi-purpose Electron Microscope from JEOL is an advanced 200kV field emission scanning transmission electron microscope (S/TEM) designed for high-throughput nanoscale imaging and chemical analysis.
活动的上架物品
0
服务
检验、保险、评估、物流
热门上架物品
- 未找到产品