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说明
spare parts list attached below配置
无配置OEM 型号描述
The NanoSpec 8000XSE is a stand-alone, automated thin film measurement system that can handle wafers ranging in size from 75 to 200 millimeters in diameter. It includes a fully integrated spectroscopic ellipsometer for ultrathin and multiple film stack measurement applications. An FTIR option can be added to measure the thickness of epi-silicon. The 8000XSE also offers a standard mechanical interface with mini-environment enclosures for use in ultra-clean manufacturing facilities and can be configured to handle substrates used in the magnetic recording head industry.文件
类别
Thin Film / Film Thickness
上次验证： 60 多天前
物品主要详细信息
状况：
Parts Tool
运行状况:
未知
产品编号：
96834
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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上次验证60 多天前
ONTO / NANOMETRICS / ACCENT / BIO-RAD
NANOSPEC 8000XSE
Thin Film / Film Thickness年份： 0状况： 二手
上次验证60 多天前
ONTO / NANOMETRICS / ACCENT / BIO-RAD
NANOSPEC 8000XSE
Thin Film / Film Thickness年份： 0状况： 二手
上次验证60 多天前
ONTO / NANOMETRICS / ACCENT / BIO-RAD
NANOSPEC 8000XSE
类别
Thin Film / Film Thickness
上次验证： 60 多天前
物品主要详细信息
状况：
Parts Tool
运行状况:
未知
产品编号：
96834
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available