SiPHER
概述
The SiPHER is a fully automated photoluminescence metrology system for the detection and mapping of 300mm substrate defects and metallic contamination. SiPHER detects and quantifies near surface and bulk metallic contamination in both bulk silicon and silicon epitaxial layers.
活动的上架物品
4
服务
检验、保险、评估、物流
热门上架物品
ONTO / NANOMETRICS / ACCENT / BIO-RAD
SiPHER
Wet Processing / Wafer Cleaning年份： 2000状况： 二手上次验证60 多天前ONTO / NANOMETRICS / ACCENT / BIO-RAD
SiPHER
Wet Processing / Wafer Cleaning年份： 状况： 二手上次验证30 天前ONTO / NANOMETRICS / ACCENT / BIO-RAD
SiPHER
Wet Processing / Wafer Cleaning年份： 12状况： 二手上次验证30 多天前ONTO / NANOMETRICS / ACCENT / BIO-RAD
SiPHER
Wet Processing / Wafer Cleaning年份： 2002状况： 二手上次验证60 多天前
