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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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FISCHERSCOPE XDVM-T7.1-W
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The FISCHERSCOPE® X-RAY XDV®-μ instruments are Fischer's high-end X-ray fluorescence series. They offer precise coating thickness measurement and material analysis on tiny structures. Equipped with powerful silicon drift detectors and polycapillary optics, they ensure quick and repeatable measurements with high radiation intensity. These instruments find applications in the electronics and semiconductor industry for measuring small structures like bond surfaces, SMD components, and thin wires. The XDV®-μ instruments feature a long-distance capillary for precise measurements on assembled PCBs and connectors. With a spacious measuring chamber, advanced polycapillary optics, and fast DPP+ digital pulse processor, they deliver accurate and efficient results.
    文件

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    FISCHERSCOPE

    XDVM-T7.1-W

    verified-listing-icon

    已验证

    类别
    X-Ray / XRD / XRF

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    84342


    晶圆尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    FISCHERSCOPE XDVM-T7.1-W

    FISCHERSCOPE

    XDVM-T7.1-W

    X-Ray / XRD / XRF
    年份: 0状况: 二手
    上次验证60 多天前

    FISCHERSCOPE

    XDVM-T7.1-W

    verified-listing-icon
    已验证
    类别
    X-Ray / XRD / XRF
    上次验证: 60 多天前
    listing-photo-7d6b7d80c35f400aa5f88e29f24b0f0f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    84342


    晶圆尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The FISCHERSCOPE® X-RAY XDV®-μ instruments are Fischer's high-end X-ray fluorescence series. They offer precise coating thickness measurement and material analysis on tiny structures. Equipped with powerful silicon drift detectors and polycapillary optics, they ensure quick and repeatable measurements with high radiation intensity. These instruments find applications in the electronics and semiconductor industry for measuring small structures like bond surfaces, SMD components, and thin wires. The XDV®-μ instruments feature a long-distance capillary for precise measurements on assembled PCBs and connectors. With a spacious measuring chamber, advanced polycapillary optics, and fast DPP+ digital pulse processor, they deliver accurate and efficient results.
    文件

    无文件

    类似上架物品
    查看全部
    FISCHERSCOPE XDVM-T7.1-W

    FISCHERSCOPE

    XDVM-T7.1-W

    X-Ray / XRD / XRF年份: 0状况: 二手上次验证:60 多天前