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PANalytical XPERT PRO MRD
    说明
    Installed and running. Complete system.
    配置
    Extended optics with option of different monochromat
    OEM 型号描述
    The PANalytical X’Pert Pro is a versatile x-ray diffractometer with a Cu Kα source. It offers high and low-resolution measurements, suitable for analyzing thin films and powder samples. Its modular design allows effortless switching between various measurement modes.
    文件

    无文件

    类别
    X-Ray / XRD / XRF

    上次验证: 30 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    111267


    晶圆尺寸:

    2"/50mm, 4"/100mm, 6"/150mm, 8"/200mm


    年份:

    2010


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    PANalytical

    XPERT PRO MRD

    verified-listing-icon
    已验证
    类别
    X-Ray / XRD / XRF
    上次验证: 30 多天前
    listing-photo-0913e28b2f32409eb414ab79afd11aa1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53362/0913e28b2f32409eb414ab79afd11aa1/8a3666763f61470b970f5cc12beea8f3_cc7b1ad674e44f5487dceefe56fa5a2e45005c_mw.jpeg
    listing-photo-0913e28b2f32409eb414ab79afd11aa1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53362/0913e28b2f32409eb414ab79afd11aa1/8f0c56580f8f485994015afecb3604b1_bcd4ea4e5f14411784c04a7174b55c65_mw.png
    listing-photo-0913e28b2f32409eb414ab79afd11aa1-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53362/0913e28b2f32409eb414ab79afd11aa1/36a412464caf4b7b90d449c0452b5b84_279b2e3ee84a4e77a7d2ea3e30c5ef3d_mw.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    111267


    晶圆尺寸:

    2"/50mm, 4"/100mm, 6"/150mm, 8"/200mm


    年份:

    2010


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Installed and running. Complete system.
    配置
    Extended optics with option of different monochromat
    OEM 型号描述
    The PANalytical X’Pert Pro is a versatile x-ray diffractometer with a Cu Kα source. It offers high and low-resolution measurements, suitable for analyzing thin films and powder samples. Its modular design allows effortless switching between various measurement modes.
    文件

    无文件