概述

Xradia 510 Versa breaks the one-micron resolution barrier for 3D imaging and in situ / 4D investigations. ZEISS Xradia 510 Versa makes synchrotron-caliber research even more practical for mid-sized imaging centers and industrial laboratories. Benefit from the two-stage magnification technique offered by ZEISS Xradia Versa to uniquely achieve RaaD, which enables you to effectively study the widest range of sample sizes. Intuitive Scout-and-Scan control software enables a broad range of user skillsets in your busy lab.