说明
Atomic Force Profiler (AFP)配置
无配置OEM 型号描述
The Dimension® AFP is the world’s only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler to monitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability. Replacing costly wafer cross-sectioning, the Dimension AFP offers the highest performance available for device characterization.文件
无文件
类别
AFM
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
119846
晶圆尺寸：
12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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BRUKER / VEECO / DIGITAL INSTRUMENTS
DIMENSION AFP
类别
AFM
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
119846
晶圆尺寸：
12"/300mm
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Atomic Force Profiler (AFP)配置
无配置OEM 型号描述
The Dimension® AFP is the world’s only fab-based metrology tool specifically designed for both CMP profiling and etch depth metrology for current and advanced technology nodes. The system combines the superb resolution of an AFM with the long-scan capability of an atomic force profiler to monitor etch depth and dishing and erosion on submicron features with unsurpassed repeatability. Replacing costly wafer cross-sectioning, the Dimension AFP offers the highest performance available for device characterization.文件
无文件