Advantest offers solutions for a wide variety of semiconductors and test needs, from SoC and memory, to R&D evaluation and system level test.

The TAS7500TS Terahertz Wave Spectroscopy and Analysis Platform consists of an optical fiber laser module and a data acquisition unit. Flexible source selection and source/detector placement allow the user to build customized configurations.

ADVANTEST

TAS7500TS

The U3800 series cross domain analyzers allow spectrum and vector signal measurements with two-channel RF inputs.
U3851: 9 kHz to 8 GHz

U3851

The ADVANTEST T5503 is the flagship model in the T5500 series, specifically designed for testing and production of ultra high-speed memory semiconductors, including DDR3-SDRAM. This advanced system provides twice the testing speed coverage of the T5501, resulting in enhanced measurement accuracy.

T5503

Resolution for faulty area detection: 5μm (Time domain: 0 to 800 ps, accumulated 16384 times), 10μm (Time domain: 800 to 1500 ps, accumulated 16384 times)

TS9001

The MPT3000HES and MPT3000HES2 systems offer the same modular hardware, operating software, thermal performance and interfaces as other members of its product family. What distinguishes this tester is a smaller yet highly efficient configuration. The MPT3000HES's and MPT3000HES2's compact size and tester-per-DUT performance make it ideally suited for applications such as low-volume testing and "copy exactly" engineering support for the MPT3000HVM and MPT3000HVM2 production test systems.

MPT3000HES2

The U3700 series spectrum analyzers are compact, lightweight, and portable. The U3700 series spectrum analyzers are ideal for use in the field because they operate on battery and can be used anywhere. Wide frequency measurement range U3771: 9 kHz - 31.8 GHz

U3771

T7315

T5723

M7521A is a test handler that can be used for chip on film, or COF, and tape automated bonding, or TAB of integrated circuit drivers used in flat-panel displays. The M7521A can test devices used in 34 millimeter, 48 millimeter, 70 millimeter, wide and superwide tapes.

M7521A

The new highly integrated measurement system "EVA100" is supporting Power Supplies, SMU( 4 quadrant DC Signal Measurement Units ), Pattern Generators, Arbitrary Waveform Generators, Digitizers and Oscilloscopes necessary for complete analog / mixed-signal / sensor / digital IC devices and Modules including Electronic Control Unit (ECU) for automotive evaluation and measurement.This new measurement system allows engineers quickly to build their own measurement environment without combining several standalone instruments.

EVA100

T5591

**PARTS**

T7723 test system is for non memory semiconductors for mixed signal integrated circuits. The T7723 targets highly complex semiconductors used in car electronics and is the result of the development of Advantest's constituent technology that measures analog signal. T7723 uses a direct current signal generator with range of 150V to 64V and floating power supply of 60V/10A or 30V/30A (pulse), utilizes up to maximum of 256 pins, and has the capacity to simultaneously measure multiple devices.

T7723

The T7721 and T7722 are test systems for non memory semiconductors for mixed signal integrated circuits. 

T7722

WAFER MVM-SEM E3310 - Multi Vision Metrology SEM supports next-generation wafers.
The E3310 is a WAFER MVM-SEM for next generation wafers, supporting 1Xnm node process development and volume production at the 22nm node and beyond. With its high-speed carrier system employing a dual arm vacuum robot, and low-vibration platform to improve measurement accuracy, the E3310 delivers high throughput and performance for wafer measurements. Its multi detector configuration and unique 3D measurement algorithm also enable stable, high-accuracy measurement of 3D transistor technologies such as FinFET. The E3310 makes a significant contribution to reducing process development turnaround time and improves productivity for next-generation devices.

E3310

The ADVANTEST T5375 is a memory semiconductor test system specifically designed for mass production of high-speed memory semiconductors such as DDR3-SDRAM, LPDDR2, and LPDDR3 in the 1 Gbps to 2 Gbps class. 

T5503A

The T7912 developed based on these device-measuring technologies cultivated in a lapse of long time is an analog test system that supports performance evaluation as well as mass production tests. It will strongly assist customers' businesses enabling high quality tests of excellent cost performance as well.

T7912

the T5782 is designed with per-site architecture and industry-leading speeds of 266MHz/533Mbps, and is ideally suited for testing today's flash memories, as well as future device generations including memory-embedded microcontrollers and rapidly evolving memory bus environments. The T5782's at-speed, at-specification performance meets the requirements of tomorrow's Known Good Die (KGD) and MCP memory solutions.

T5782

Broadband System
The TAS7400 product line offers a series of low-cost, all-purpose spectroscopic systems that enable spectroscopic measurements using terahertz (THz) waves. The tools are capable of performing non-destructive analysis on a wide variety of sample types, making it applicable to a broad range of fields from life sciences to electronics, where precise chemical and material characterization is critical. The systems are ideal for settings ranging from basic research to product development, as well as for manufacturing and quality control, and employ easy-to-use spectroscopic methods that do not require specialized knowledge of THz wave generation or optics.

TAS7400SU

The T5761ES retains the same capabilities and functions as the T5761 with a substantially smaller size an at lower testing costs. The T5761ES is capable of simultaneous testing up to 16 devices, evaluation devices in a simplified manner and easily making testing programs available for mass-production. Through the use of the T5761/T5761ES, effective solutions can be structured, from the design of NAND-type flash memory to mass production.

T5761ES

Memory Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.

T5851ES

T6567

Terahertz Spectroscopic System
The TAS7500 series is a family of compact and multipurpose terahertz spectroscopic / imaging systems. Utilizing the unique properties of the terahertz region (0.1 - 10.0THz) of the electromagnetic spectrum, these systems perform non-destructive analysis of pharmaceuticals, chemicals, communications materials, etc., without requiring a specially constructed analysis environment. Speed and ease of operation are the hallmarks of Advantest's terahertz analysis systems. In addition to industrial applications, the TAS7500 series is also an optimal choice for terahertz - related research, leveraging Advantest's high-precision detection technology to provide best-in-class sampling performance.

TAS7500SP

M6721AD

T6331

Synchronized 2-Channel Generation, Measurement
Measurement Resolution of 1 µV, 10 fA (SMU220-2), 100 pA (SMU62-20)
Source Range ±220 V, ±2 A (SMU220-2, 2.4 W)/±62 V, ±20 A (SMU62-20, 140 W)
Minimum Pulse Width 100 µs, Minimum Step 700 µ

R6246

T 5503F

The R3760 network analyzer, low in cost and with a space-saving design, measures and evaluates the frequency characteristics of receiving/transmitting antennas and filters, which are used for wireless communications such as mobile phones, WiMAX, WiFi, and ETC systems for ubiquitous communication.



R3760

The M6242 supports memory device package types such as BGA and CSP, and its throughput of 42,200 units per hour is more than double that of the company's previous model, M6241. It offers highly efficient device transfer, thanks to optimization of the complex arm mechanisms that sort good and bad devices after testing. The M6242 enhances productivity and slashes overall cost of test.

M6242

Defect Review SEM supports next-generation photomasks
The E5610 is a MASK DR-SEM(Defect Review - Scanning Electron Microscope) for reviewing and classifying ultra-small defects in photomask and blanks.
Utilizing Advantest's highly stable, full automatic image capture technology, the E5610 easily imports defect location data from mask inspection systems and automatically images the locations. In addition, it features a newly developed EDS(Energy Dispersive X-ray Spectrometry) module that performs elemental analysis. With its high-accuracy, high-throughput defect review capability, the E5610 is expected to contribute to next-generation photomask production quality improvement and shorter manufacturing TAT.

E5610

R3860A

MPT3000HES

M4642A

The ATS 5034 SLT (System-Level Test Platform) delivers a level of sophisticated testing that automates system level testing on a massive scale, making it easy and affordable to conduct 100% SLT. Test up to 396 DUTs simultaneously to achieve a throughput volume of up to 5,000 units per hour (UPH). Combine this throughput with a small factory floor footprint and achieve the industry's lowest cost of system-level test.

ATS 5034

T2000 CAL BOARD

The M4541A Dynamic Test Handler is capable of simultaneously testing up to four logic devices, including MCUs, ASICs, and SOCs. This new handler possesses a maximum throughput of 6,000 devices per hour, roughly twice that of its predecessors. The handler's efficient structural layout provides a smaller footprint while helping to reduce testing costs.

M4541A

T5581D

The T6362 and T6372 are test systems for non memory semiconductors for semiconductors used with high-definition LCD displays. This system can simultaneously test multiple semiconductors for LCD driver integrated circuits with a total of up to 1,536 pins.

T6362

T3347P

T5781

The T5761 covers the full range of testing, from NAND-type flash memory testing to package testing. The T5761 is capable of simultaneous testing up to 512 devices, which is twice the capability of Advantest's previous model, and allow for lower testing costs through its improved ability to detect failures. 

T5761

The U3800 series cross domain analyzers allow spectrum and vector signal measurements with two-channel RF inputs. 
U3841: 9 kHz to 3 GHz

U3841

R3261A

T5833ES

Unique in its class, Advantest's M4841 Test Handler enables high-throughput parallel test for very high volumes of devices and supports complex ICs and packages, including BGA, CSP and QFP. Because of its advanced performance capabilities and features, the M4841 is the optimal test handler for high volume production of devices used in consumer products such as portable digital equipment and automotive systems.

M4841

B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.

B6700

T6565A

Advantest's new E3640 Multi Vision Metrology Scanning Electron Microscope (MVM-SEM) tool supports pattern measurement for photomasks and other patterned media at dimensions as small as 1Xnm. A new entry in Advantest's widely-adopted E3600 Series of SEM systems, the E3640 delivers significantly improved measurement accuracy and higher throughput. Its industry-best pattern measurement capability supports the coming shift to the 1Xnm node for semiconductor volume production. In addition to photomasks for standard semiconductor lithography, the E3640 also offers enhanced metrology performance for EUV masks and NIL templates.

E3640

T6673 PE CARD

The ADVANTEST T5377 is a multi-functional test system designed for memory semiconductors, aimed at reducing testing costs for semiconductor manufacturers. It serves both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the capability to test up to 256 devices simultaneously, the T5377 significantly improves testing efficiency. The T5377 offers double the throughput capabilities of its predecessor, the T5371, resulting in higher production rates and decreased testing costs for customers. It optimizes its memory repair analytical structure to align with a user's memory repair algorithm, making it well-suited for semiconductor manufacturing facilities that utilize 300-millimeter wafers.

T5377

The ADVANTEST T2000 is a highly versatile test platform with a module architecture, allowing flexible reconfiguration for different applications. It offers a wide range of functional modules, including digital, high-performance analog, power-mixed signals, and image capture, enabling comprehensive test coverage at an optimal cost. The T2000's scalability spans from a 9-slot air cooling system to a 52-slot liquid cooling system with up to 8,192 channels. Advantest offers compact solutions for reduced initial investment in development and small lot productions, as well as high-efficiency multiple-DUT parallel measurement solutions for mass productions. The T2000 quickly adapts to market needs with minimal capital investment, making it a preferred choice in the semiconductor industry.

T2000

T5585

T5371

M6541AD

The M6300 delivers a throughput of up to 12,000 units-per- hour (UPH). Its thermal-control function supports tests within a temperature range of -30 degrees C to +125 degrees C, with an option to extend the lower range to -55 degrees C.

M6300

M6771AD

The ADVANTEST T5375 is a multi-functional test system designed for memory semiconductors, offering cost-saving benefits for semiconductor manufacturers. It is utilized for both front-end testing of DRAM semiconductors and back-end testing of flash memory semiconductors. With the ability to test up to 256 devices simultaneously, the T5375 provides efficient and high-throughput testing. The T5375 is specifically focused on capturing an increased market share in front-end DRAM semiconductor testing

T5375

The ADVANTEST T5588, or T5588 System on Chip (SoC) Tester, is a state-of-the-art semiconductor testing equipment from Advantest Corporation. This advanced system is tailored to conduct thorough testing and verification of integrated circuits (ICs) and SoCs throughout the manufacturing process. With its cutting-edge capabilities, the T5588 ensures high precision and efficiency in semiconductor testing, making it a valuable tool for semiconductor manufacturers seeking top-level performance and reliability.

T5588

The ADVANTEST T5593 is a specialized test system designed for memory semiconductors, specifically targeting high-speed SRAM, DDR-SRAM, DDR2-SDRAM, DDR3-SDRAM, SGRAM, and DRAM markets. SRAM, which stands for static random access memory, is a type of semiconductor memory that does not require refreshing while powered on, unlike DRAM. SGRAM, or synchronous graphics random access memory, is used for graphics applications. The T5593 is optimized for designing and manufacturing super high-speed memory devices. It offers the capability to simultaneously test up to 256 DDR2-SDRAM devices, providing efficient and reliable testing for these memory types. 

 T5593

Advantest‘s new T5592 Memory Test System for use in the mass production of Direct Rambus DRAM (D-RDRAM). The T5592 is capable of testing up to 64 devices in parallel and has a testing speed of 1.066 GHz.

T5592

The ADVANTEST T2000 LS is a highly versatile test platform with a modular architecture, allowing flexible reconfiguration based on the application's requirements. It offers a diverse range of functional modules, including digital, high-performance analog, power-mixed signals, and image capture, ensuring extensive test coverage at an optimal cost. The T2000 LS can be scaled from a 9-slot air cooling system to a 52-slot liquid cooling system with up to 8,192 channels, catering to various testing needs in the semiconductor industry.

T2000 LS

D3186 is a high-performance pulse pattern generator to generate 7 types of pseudo-random (PRBS) patterns from 2(7)-1 to 2(31) -1, programmable (WORD) patterns up to SM 2(23) bits, or frame patterns of SDH or SONET structure at very high speed from 150 Mb/s to 12 Gb/s. Moreover, a system, which is used to evaluate the bit error rate of super-high speed optical communication devices and compound semiconductors, can be structured by combining D3186 with the D3286 error detector.

D3186

M6542AD

T5581H

The ADVANTEST T5377S is a versatile memory test system capable of efficiently and cost-effectively testing a wide range of memory types. This system can handle both traditional and high-speed memory interfaces, making it suitable for various memory testing requirements. With its advanced features and capabilities, the T5377S ensures reliable and accurate testing, optimizing the testing process for memory devices while keeping costs under control.

T5377S

The T2000 EPP system enables module splitting, in which one module can test multiple devices concurrently. Each device under test (DUT) can be monitored and assessed independently.

T2000 EPP

The ADVANTEST M6741A is an exceptional memory device handler known for its top-notch performance and speed. It is considered one of the best and fastest handlers available on the used market. With its advanced capabilities, the M6741A efficiently handles memory devices, making it a highly sought-after solution for various applications.

M6741A

The top-of-the-line device in the T5500 series is the T5501, a memory semiconductor test system most suitable for testing and production of ultra high-speed memory semiconductor such as the next generation SGRAM. This model allows twice as much spectrum band to be covered in terms of testing speed as the T5593 and thus enhances the measurement accuracy.

T5501

D3286

T6535

The ADVANTEST T5503HS is an advanced semiconductor testing system developed by Advantest Corporation. This system is specifically designed to offer comprehensive testing and verification of high-speed digital and mixed-signal semiconductor devices throughout the manufacturing process. Its sophisticated capabilities ensure precise and reliable testing, making it an essential tool for semiconductor manufacturers seeking top-level performance and quality assurance.

T5503HS

T5335P

The ADVANTEST T6372 is a test system specifically developed for non-memory semiconductors used in high-definition LCD displays. It enables simultaneous testing of multiple semiconductors for LCD driver integrated circuits, accommodating a total of up to 1,536 pins. 

T6372

M6751AD

A pick-and-place hander that handles eight DUTS in parallel for a total throughput of up to 8,000 devices per hour.
The M4871 handler features a variety of capabilities for improving test yields and reducing cycle times. An advanced visual-alignment function enables positioning accuracy of below 0.3 mm ball/pad pitch for handling fine-pitch semiconductors and devices with both top- and bottom-side contacts. This precise alignment capability also helps to speed up set-up and calibration times for greater test-cell productivity.

M4871

T5365P

T3347A

T5832

MPT3000ENV

B6700DES incorporates all capabilities of B6700D into a smaller configuration for engineering purpose. It contributes to a reduced TAT (turn around time) from R&D to device production.

B6700DES

T5771

The T6577 test systems for SoC semiconductors in the T6500 series are primarily designed to test MCU and SoC semiconductors that control digital consumer products at the production lines. The T6500 series is approximately one-third in size, and uses approximately 50% less power, as compared to Advantest's predecessor product line. Further, the T6500 series operates on a software that is compatible with T6600 series.

T6577

T5372

T5335

The T5383, which is capable of simultaneously testing up to 384 devices and has the same footprint as the T5377S with the capacity to test up to 50% more devices at one time, is a test system with a maximum testing rate is 286 MHz/572 Mbps, which is twice the testing rate for Advantest's previous model.

T5383

The M6751A Dynamic Test Handler processes 4500 devices per hour through design breakthroughs that concentrate high-speed handling technologies. The M6751A Dynamic Test Handler processes 4500 devices per hour through design breakthroughs that concentrate high-speed handling technologies. Aimed at the memory device market, including TSOP, SOJ, QFP, BGA, and CSP set-ups, the device provides an advanced memory production system.

M6751A

M6741AD

T6672

The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.

T5833

The M6242 and M6243 test handlers for test systems for memory semiconductors, including DDR3-SDRAM, can handle up to 512 semiconductors at a time. Their maximum throughput is 42,200 semiconductors per hour through the use of a new high-speed handling technology that shortens the time between tests to approximately half of the time associated with Advantest’s ordinary model. In addition, the M6242 and M6243 have a built-in temperature control device which can minimize the temperature fluctuation within a 1.5°C range for temperatures between -10°C and 100°C. 

M6243

HIFIX

The ADVANTEST T2000 IPS (Integrated Power Device Test Solution) is an advanced testing system specifically designed for automotive and power management applications. With its high-performance and high-throughput capabilities, the T2000 IPS efficiently tests various devices used in these industries. This comprehensive solution offers a wide range of feature-rich capabilities, ensuring precise and reliable testing of automotive and power management components. Moreover, the T2000 IPS plays a crucial role in reducing test costs by increasing throughput without compromising on the quality of testing results.

T2000 IPS

The T6673 is designed to reduce total test costs associated with the production of SoC semiconductors. The T6673 is designed to test SiC semiconductors incorporated into high-speed communication network equipment and wireless handsets, digital consumer products and other electronic systems. The T6673 can test semiconductor chips with a maximum pin count 1,024, thus matching the trend of SoC semiconductors with increasing pin counts. The T6673 is capable of both front- and back-end testing of SoC semiconductors.

T6673

T5581P

B6700S system offers a dramatically lower-cost test solution for NAND flash memories while offering the same capabilities as its sister systems. The B6700S offers a unitized function of the B6700D and can be embedded within a multi-wafer probing system used in individual wafer-level testing, avoiding any costs associated with occupying floor space in lab or production environments.

B6700S

T5334

T 5771ES

TR6846

The M6541A Dynamic Test Handler is designed with a proprietary four-step handling function that keeps index time to a minimum, the M6541A can handle simultaneous testing of up to 64 devices — 6,000 devices per hour. The M6541A's touch panel and comprehensive help function make it extremely easy to operate. In addition, the system was designed so that the time needed for establishing operating requirements and correcting problems are significantly reduced.

M6541A

T5781 Engineering Station (T5781ES), which is designed for evaluation of devices and development of test programs in a developmental / laboratory environment. 

ADVANTEST

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