说明
无说明配置
无配置OEM 型号描述
Introduced in fiscal 2002, the NanoSEM 3D system extends CD-SEM technology beyond the measurement of critical dimensions to enable the three-dimensional imaging of chip features to more precisely control their lithography and etch processes.文件
无文件
APPLIED MATERIALS (AMAT)
NANOSEM 3D
已验证
类别
CD-SEM
上次验证: 60 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
44380
晶圆尺寸:
未知
年份:
2003
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
类似上架物品
查看全部APPLIED MATERIALS (AMAT)
NANOSEM 3D
类别
CD-SEM
上次验证: 60 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
44380
晶圆尺寸:
未知
年份:
2003
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
Introduced in fiscal 2002, the NanoSEM 3D system extends CD-SEM technology beyond the measurement of critical dimensions to enable the three-dimensional imaging of chip features to more precisely control their lithography and etch processes.文件
无文件