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HITACHI S-7840
  • HITACHI S-7840
  • HITACHI S-7840
  • HITACHI S-7840
说明
Hitachi S-7840 CD-SEM 100mm cassette/ wafer configuration, tool is mechanically functional, but requires a new tip to be restored to full operation.
配置
无配置
OEM 型号描述
S-7840 review SEM has been incorporated with (1) ADR (automatic defect review) and ADC (automatic defect classification), (2) data interface with various inspection equipment, (3) an interface which transfers review results with SEM images showing the defects to an advanced data analysis system, and (4) defect sampling function which allows selection of type of defects for reviewing.
文件

无文件

verified-listing-icon

已验证

类别
CD-SEM

上次验证: 12 天前

物品主要详细信息

状况:

Used


运行状况:

Installed / Running


产品编号:

124432


晶圆尺寸:

4"/100mm


年份:

2000


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

HITACHI

S-7840

verified-listing-icon
已验证
类别
CD-SEM
上次验证: 12 天前
listing-photo-4bf59230be9b4c47a3e385c24c7ea978-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/48508/4bf59230be9b4c47a3e385c24c7ea978/e165560d593e45c1a5a1d88ef10146d1_1_mw.png
listing-photo-4bf59230be9b4c47a3e385c24c7ea978-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/48508/4bf59230be9b4c47a3e385c24c7ea978/a585123130ff487296f359de18c9293b_3_mw.png
listing-photo-4bf59230be9b4c47a3e385c24c7ea978-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/48508/4bf59230be9b4c47a3e385c24c7ea978/566fb189d5574edaba5715b7c332ad07_2_mw.png
物品主要详细信息

状况:

Used


运行状况:

Installed / Running


产品编号:

124432


晶圆尺寸:

4"/100mm


年份:

2000


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Hitachi S-7840 CD-SEM 100mm cassette/ wafer configuration, tool is mechanically functional, but requires a new tip to be restored to full operation.
配置
无配置
OEM 型号描述
S-7840 review SEM has been incorporated with (1) ADR (automatic defect review) and ADC (automatic defect classification), (2) data interface with various inspection equipment, (3) an interface which transfers review results with SEM images showing the defects to an advanced data analysis system, and (4) defect sampling function which allows selection of type of defects for reviewing.
文件

无文件