CG7300
类别
CD-SEM概述
The CG7300 provides enhanced high-precision measurement and improved throughput performance. The tool is based on a "common platform concept" that has been extended from previous model CG6300. This model is geared toward mass production of 5nm generation devices and development of 3nm generation devices for EUV*2 Lithography.
活动的上架物品
0
服务
检验、保险、评估、物流
热门上架物品
- 未找到产品