说明
无说明配置
无配置OEM 型号描述
The S-6000 was Hitachi's pioneering CD-SEM system for micro-scale dimensional measurement of semiconductors. Developed through a collaboration between Hitachi's electron microscope and semiconductor divisions, it aimed to provide a comprehensive measurement solution rather than just hardware. Designed with user-centric features, it eliminated the need for a dark room and offered easy calibration. Adopted globally by semiconductor manufacturers, the S-6000 set a new standard in semiconductor measurement, ensuring high reliability, accuracy, and user-friendliness.文件
无文件
HITACHI
S-6000
已验证
类别
CD-SEM
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
117342
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
HITACHI
S-6000
类别
CD-SEM
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
117342
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
The S-6000 was Hitachi's pioneering CD-SEM system for micro-scale dimensional measurement of semiconductors. Developed through a collaboration between Hitachi's electron microscope and semiconductor divisions, it aimed to provide a comprehensive measurement solution rather than just hardware. Designed with user-centric features, it eliminated the need for a dark room and offered easy calibration. Adopted globally by semiconductor manufacturers, the S-6000 set a new standard in semiconductor measurement, ensuring high reliability, accuracy, and user-friendliness.文件
无文件