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APPLIED MATERIALS (AMAT) COMPLUS MP
    说明
    Dark field detection No missing parts Current Wafer size : 12
    配置
    无配置
    OEM 型号描述
    AMAT / APPLIED MATERIALS ComPlus MP is a wafer inspection system which can be used with 8" wafer sizes. The ComPlus-EV can be further enhanced with the MP (Multi-Perspective) option, which extends the system's exceptional capabilities to perform additional brightfield applications, including the detection of defects in the transistor area such as STI, gate, and tungsten plug layers. The MP option expands the number of detectors and magnifications, enabling higher sensitivity to flat defects at an increased capture rate, providing significantly higher throughput and reduced cost of ownership.
    文件

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    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    verified-listing-icon

    已验证

    类别
    Defect Inspection

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    Deinstalled


    产品编号:

    107073


    晶圆尺寸:

    8"/200mm, 12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect Inspection
    年份: 0状况: 二手
    上次验证14 天前

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    verified-listing-icon
    已验证
    类别
    Defect Inspection
    上次验证: 60 多天前
    listing-photo-a9188044dee547ceae216cd763a329ca-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    Deinstalled


    产品编号:

    107073


    晶圆尺寸:

    8"/200mm, 12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Dark field detection No missing parts Current Wafer size : 12
    配置
    无配置
    OEM 型号描述
    AMAT / APPLIED MATERIALS ComPlus MP is a wafer inspection system which can be used with 8" wafer sizes. The ComPlus-EV can be further enhanced with the MP (Multi-Perspective) option, which extends the system's exceptional capabilities to perform additional brightfield applications, including the detection of defects in the transistor area such as STI, gate, and tungsten plug layers. The MP option expands the number of detectors and magnifications, enabling higher sensitivity to flat defects at an increased capture rate, providing significantly higher throughput and reduced cost of ownership.
    文件

    无文件

    类似上架物品
    查看全部
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect Inspection年份: 0状况: 二手上次验证:14 天前
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect Inspection年份: 0状况: 二手上次验证:14 天前
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect Inspection年份: 0状况: 二手上次验证:60 多天前