说明
Applied Materials SEMVision STAR Defect Analysis, Scanning Electron Microscope配置
Inspection LD: 2ea, AsystInspection SEMOEM 型号描述
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.文件
无文件
APPLIED MATERIALS (AMAT)
SEMVISION G2
已验证
类别
Defect Inspection
上次验证： 15 天前
物品主要详细信息
状况：
Used
运行状况:
Installed / Running
产品编号：
93121
晶圆尺寸：
未知
年份：
2002
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
类似上架物品
查看全部无类似上架物品
APPLIED MATERIALS (AMAT)
SEMVISION G2
类别
Defect Inspection
上次验证： 15 天前
物品主要详细信息
状况：
Used
运行状况:
Installed / Running
产品编号：
93121
晶圆尺寸：
未知
年份：
2002
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Applied Materials SEMVision STAR Defect Analysis, Scanning Electron Microscope配置
Inspection LD: 2ea, AsystInspection SEMOEM 型号描述
The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.文件
无文件
类似上架物品
查看全部无类似上架物品