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APPLIED MATERIALS (AMAT) SEMVISION G2
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.
    文件

    无文件

    APPLIED MATERIALS (AMAT)

    SEMVISION G2

    verified-listing-icon

    已验证

    类别
    Defect Inspection

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    108850


    晶圆尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
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    APPLIED MATERIALS (AMAT) SEMVISION G2

    APPLIED MATERIALS (AMAT)

    SEMVISION G2

    Defect Inspection
    年份: 2004状况: 二手
    上次验证60 多天前

    APPLIED MATERIALS (AMAT)

    SEMVISION G2

    verified-listing-icon
    已验证
    类别
    Defect Inspection
    上次验证: 60 多天前
    listing-photo-4e70c292ed7c4078871490d84029ee65-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    108850


    晶圆尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The AMAT SEMVision G2 is a high-throughput, fully automatic Defect Analysis system developed by Applied Materials (AMAT). It is designed to be seamlessly integrated into production lines, allowing customers to analyze defects with exceptional productivity. The system is capable of detecting and analyzing defects as small as 50nm, providing crucial insights into the quality and performance of semiconductor devices during manufacturing.
    文件

    无文件

    类似上架物品
    查看全部
    APPLIED MATERIALS (AMAT) SEMVISION G2

    APPLIED MATERIALS (AMAT)

    SEMVISION G2

    Defect Inspection年份: 2004状况: 二手上次验证:60 多天前
    APPLIED MATERIALS (AMAT) SEMVISION G2

    APPLIED MATERIALS (AMAT)

    SEMVISION G2

    Defect Inspection年份: 0状况: 二手上次验证:60 多天前