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APPLIED MATERIALS (AMAT) SEMVISION G2+
  • APPLIED MATERIALS (AMAT) SEMVISION G2+
  • APPLIED MATERIALS (AMAT) SEMVISION G2+
  • APPLIED MATERIALS (AMAT) SEMVISION G2+
  • APPLIED MATERIALS (AMAT) SEMVISION G2+
  • APPLIED MATERIALS (AMAT) SEMVISION G2+
  • APPLIED MATERIALS (AMAT) SEMVISION G2+
  • APPLIED MATERIALS (AMAT) SEMVISION G2+
  • APPLIED MATERIALS (AMAT) SEMVISION G2+
说明
无说明
配置
无配置
OEM 型号描述
As part of the SEMVision G2 family, Applied SEMVision G2 Plus Defect Analysis system is the production-proven workhorse for inline defect review and analysis for the 65nm era. Continuing the productivity leadership of the SEMVision product line, G2 Plus delivers high throughput, extreme sensitivity and automated calibrations, offering the most advanced capabilities for production and engineering applications. Field proven applications such as High Aspect Ratio imaging, tilt imaging and material analysis provide customers the ability to control their defects and processes with greater success, leading to higher yields and faster time to market.
文件

无文件

类别
Defect Inspection

上次验证: 60 多天前

物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

120213


晶圆尺寸:

未知


年份:

未知


Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

APPLIED MATERIALS (AMAT)

SEMVISION G2+

verified-listing-icon
已验证
类别
Defect Inspection
上次验证: 60 多天前
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listing-photo-df00e10d4df241dcb47057bd20e1640a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44051/df00e10d4df241dcb47057bd20e1640a/56e52bd8da4f4e01858528ba4d827b49_416e63167a034fcb9e607c9a0c9f3b91_mw.jpeg
listing-photo-df00e10d4df241dcb47057bd20e1640a-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/44051/df00e10d4df241dcb47057bd20e1640a/51daef6f95ef490983b516923fdd117c_6c64cc849e5e484cb5ba40bce38904e8_mw.jpeg
物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

120213


晶圆尺寸:

未知


年份:

未知


Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明
配置
无配置
OEM 型号描述
As part of the SEMVision G2 family, Applied SEMVision G2 Plus Defect Analysis system is the production-proven workhorse for inline defect review and analysis for the 65nm era. Continuing the productivity leadership of the SEMVision product line, G2 Plus delivers high throughput, extreme sensitivity and automated calibrations, offering the most advanced capabilities for production and engineering applications. Field proven applications such as High Aspect Ratio imaging, tilt imaging and material analysis provide customers the ability to control their defects and processes with greater success, leading to higher yields and faster time to market.
文件

无文件