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APPLIED MATERIALS (AMAT) SEMVISION G3 FIB
  • APPLIED MATERIALS (AMAT) SEMVISION G3 FIB
  • APPLIED MATERIALS (AMAT) SEMVISION G3 FIB
  • APPLIED MATERIALS (AMAT) SEMVISION G3 FIB
说明
无说明
配置
DR-SEM Inspecting
OEM 型号描述
The Applied SEMVision G3 FIB integrates advanced defect review SEM capability with automated focused ion beam (FIB) technology in one system. The FIB provides a cross-sectional view of the defects reviewed by the SEM, enabling chipmakers to analyze the defects in minutes as part of their in-line review process.
文件

无文件

类别
Defect Inspection

上次验证: 30 多天前

物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

129920


晶圆尺寸:

未知


年份:

未知


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

APPLIED MATERIALS (AMAT)

SEMVISION G3 FIB

verified-listing-icon
已验证
类别
Defect Inspection
上次验证: 30 多天前
listing-photo-460e5aa7399a483590013ad3555f2e87-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

129920


晶圆尺寸:

未知


年份:

未知


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明
配置
DR-SEM Inspecting
OEM 型号描述
The Applied SEMVision G3 FIB integrates advanced defect review SEM capability with automated focused ion beam (FIB) technology in one system. The FIB provides a cross-sectional view of the defects reviewed by the SEM, enabling chipmakers to analyze the defects in minutes as part of their in-line review process.
文件

无文件