说明
-Main System Active damping subsystem (1) -Handler System E-chuck wafer holder & controller (1) -Factory Interface FOUP (2) -Handler System Pre Aligner (1)配置
E84, SECS/GEM, GEM300: CIM Software Version: 5.4.500OEM 型号描述
The SEMVISION G5 is part of the Applied SEMVision™ family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 2,400 defects per hour. Used in an optimized defect review strategy, these systems can accelerate customers’ production ramp by rapidly identifying the root cause of systematic and yield-limiting defects.文件
无文件
类别
Defect Inspection
上次验证： 18 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
150394
晶圆尺寸：
12"/300mm
年份：
2012
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
APPLIED MATERIALS (AMAT)
SEMVISION G5 HP
类别
Defect Inspection
上次验证： 18 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
150394
晶圆尺寸：
12"/300mm
年份：
2012
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
-Main System Active damping subsystem (1) -Handler System E-chuck wafer holder & controller (1) -Factory Interface FOUP (2) -Handler System Pre Aligner (1)配置
E84, SECS/GEM, GEM300: CIM Software Version: 5.4.500OEM 型号描述
The SEMVISION G5 is part of the Applied SEMVision™ family, which is the industry’s fastest and most sensitive line of defect review and analysis tools for 65/45nm manufacturing and beyond. The new line of three systems sets the industry benchmark with 30nm sensitivity and throughputs of up to 2,400 defects per hour. Used in an optimized defect review strategy, these systems can accelerate customers’ production ramp by rapidly identifying the root cause of systematic and yield-limiting defects.文件
无文件