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APPLIED MATERIALS (AMAT) UVISION 200
    说明
    System has always been under full service contract and is in very good conditioning. Uvision SP 200 is a BF (Bright Field) wafer inspection tool It is designed to inspect pattern wafers, but it can also inspect bare and unpatterned wafers Ligth source: Laser ( ג= 266 nm) Tool scans a wafer in a meander path Die to Die ” and Cell to Cell ” comparison capability Can use reflected --( BrigthField ) and scattered signal (GF = GreyField ) in parallel for detection On pattern wafers capable of detecting defects of 25 nm with 90 % Capture Rate (Data from D&E recipe
    配置
    Uvision SP 200 is a BF (Bright Field) wafer inspection tool 200/300 mm capebiliity It is designed to inspect pattern wafers, but it can also inspect bare and unpatterned wafers Ligth source: Laser ( ג= 266 nm) Tool scans a wafer in a meander path Die to Die ” and Cell to Cell ” comparison capability Can use reflected --( BrigthField ) and scattered signal (GF = GreyField ) in parallel for detection On pattern wafers capable of detecting defects of 25 nm with 90 % Capture Rate (Data from D&E recipe,
    OEM 型号描述
    未提供
    文件

    无文件

    APPLIED MATERIALS (AMAT)

    UVISION 200

    verified-listing-icon

    已验证

    类别
    Defect Inspection

    上次验证: 30 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    Installed / Running


    产品编号:

    113572


    晶圆尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    APPLIED MATERIALS (AMAT) UVISION 200

    APPLIED MATERIALS (AMAT)

    UVISION 200

    Defect Inspection
    年份: 2006状况: 二手
    上次验证60 多天前

    APPLIED MATERIALS (AMAT)

    UVISION 200

    verified-listing-icon
    已验证
    类别
    Defect Inspection
    上次验证: 30 多天前
    listing-photo-5bea7f55705c4ad5abbb43a73b2caae3-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    Installed / Running


    产品编号:

    113572


    晶圆尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    System has always been under full service contract and is in very good conditioning. Uvision SP 200 is a BF (Bright Field) wafer inspection tool It is designed to inspect pattern wafers, but it can also inspect bare and unpatterned wafers Ligth source: Laser ( ג= 266 nm) Tool scans a wafer in a meander path Die to Die ” and Cell to Cell ” comparison capability Can use reflected --( BrigthField ) and scattered signal (GF = GreyField ) in parallel for detection On pattern wafers capable of detecting defects of 25 nm with 90 % Capture Rate (Data from D&E recipe
    配置
    Uvision SP 200 is a BF (Bright Field) wafer inspection tool 200/300 mm capebiliity It is designed to inspect pattern wafers, but it can also inspect bare and unpatterned wafers Ligth source: Laser ( ג= 266 nm) Tool scans a wafer in a meander path Die to Die ” and Cell to Cell ” comparison capability Can use reflected --( BrigthField ) and scattered signal (GF = GreyField ) in parallel for detection On pattern wafers capable of detecting defects of 25 nm with 90 % Capture Rate (Data from D&E recipe,
    OEM 型号描述
    未提供
    文件

    无文件

    类似上架物品
    查看全部
    APPLIED MATERIALS (AMAT) UVISION 200

    APPLIED MATERIALS (AMAT)

    UVISION 200

    Defect Inspection年份: 2006状况: 二手上次验证:60 多天前
    APPLIED MATERIALS (AMAT) UVISION 200

    APPLIED MATERIALS (AMAT)

    UVISION 200

    Defect Inspection年份: 0状况: 二手上次验证:30 多天前