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说明
无说明配置
Macro InspectingOEM 型号描述
Defect Inspection and Advanced Packaging Applications. SPARK defect inspection system, offers ultra-fast inspection of patterned and unpatterned semiconductor wafers. SPARK inspection systems in configurations to provide high throughput, reduced footprint systems for leading 300mm wafer metrology applications including OCD, overlay, and thin film process control.文件
无文件
类别
Defect Inspection
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
129951
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ONTO / NANOMETRICS / ACCENT / BIO-RAD
SPARK
类别
Defect Inspection
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
129951
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
Macro InspectingOEM 型号描述
Defect Inspection and Advanced Packaging Applications. SPARK defect inspection system, offers ultra-fast inspection of patterned and unpatterned semiconductor wafers. SPARK inspection systems in configurations to provide high throughput, reduced footprint systems for leading 300mm wafer metrology applications including OCD, overlay, and thin film process control.文件
无文件