说明
无说明配置
无配置OEM 型号描述
The FEI Expida 1285 offers the ultimate in defect characterization, failure analysis and TEM sample preparation on patterned and unpatterned wafers. With fast and accurate 3D defect characterization, you get increased control and improved yield. The Expida 1285 includes an integrated front-end module designed to simultaneously handle 200mm and 300mm wafers using load port modules in addition to all of the performance specification of the Expida 1255S.文件
类别
Defect Inspection
上次验证： 5 天前
物品主要详细信息
状况：
Used
运行状况:
Installed / Running
产品编号：
149638
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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THERMOFISHER SCIENTIFIC / FEI / PHILIPS
EXPIDA 1285
类别
Defect Inspection
上次验证： 5 天前
物品主要详细信息
状况：
Used
运行状况:
Installed / Running
产品编号：
149638
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available