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说明
无说明配置
无配置OEM 型号描述
The first multiple e-beam (multibeam) wafer inspection system for in-line defect inspection applications. Following in the footsteps of the eScan 1000, the eScan 1100 offers new levels of efficiency in high throughput wafer inspection.文件
无文件
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
72756
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ASML / HMI
eScan 1100
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
72756
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
The first multiple e-beam (multibeam) wafer inspection system for in-line defect inspection applications. Following in the footsteps of the eScan 1000, the eScan 1100 offers new levels of efficiency in high throughput wafer inspection.文件
无文件