说明
Surface Analyzer配置
无配置OEM 型号描述
The Candela OSA 6100 and 6120 series systems introduce X-Beam channel technology, adding radial illumination to the existing circumferential illumination design, plus advanced collection optics that extend defect sensitivity down to 80nm. This multi-channel system simultaneously detects and classifies defects such as particles, pits and stains; characterizes lubricant thickness, and uses the Kerr Effect to characterize magnetic imaging.文件
无文件
KLA
CANDELA 6120
已验证
类别
Defect Inspection
上次验证: 30 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
89768
晶圆尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
类似上架物品
查看全部KLA
CANDELA 6120
类别
Defect Inspection
上次验证: 30 多天前
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
89768
晶圆尺寸:
未知
年份:
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Surface Analyzer配置
无配置OEM 型号描述
The Candela OSA 6100 and 6120 series systems introduce X-Beam channel technology, adding radial illumination to the existing circumferential illumination design, plus advanced collection optics that extend defect sensitivity down to 80nm. This multi-channel system simultaneously detects and classifies defects such as particles, pits and stains; characterizes lubricant thickness, and uses the Kerr Effect to characterize magnetic imaging.文件
无文件