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说明
E-beam Inspection配置
无配置OEM 型号描述
The eS805 Series electron-beam wafer defect inspection systems capture physical and electrical defects on a broad range of materials, layers and structures and feature a new image computer, new auto-focus subsystem and higher beam current densities.文件
无文件
KLA
eS805
类别
Defect Inspection
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
50097
晶圆尺寸：
12"/300mm
年份：
未知
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说明
E-beam Inspection配置
无配置OEM 型号描述
The eS805 Series electron-beam wafer defect inspection systems capture physical and electrical defects on a broad range of materials, layers and structures and feature a new image computer, new auto-focus subsystem and higher beam current densities.文件
无文件