说明
E-beam Inspection配置
无配置OEM 型号描述
The eS805 Series electron-beam wafer defect inspection systems capture physical and electrical defects on a broad range of materials, layers and structures and feature a new image computer, new auto-focus subsystem and higher beam current densities.文件
无文件
KLA
eS805
已验证
类别
Defect Inspection
上次验证： 16 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
50097
晶圆尺寸：
12"/300mm
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
eS805
类别
Defect Inspection
上次验证： 16 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
50097
晶圆尺寸：
12"/300mm
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
E-beam Inspection配置
无配置OEM 型号描述
The eS805 Series electron-beam wafer defect inspection systems capture physical and electrical defects on a broad range of materials, layers and structures and feature a new image computer, new auto-focus subsystem and higher beam current densities.文件
无文件