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KLA 2139
    说明
    KLA 2139-UI User Interface Console Inspection Station Diagnose Monitor Interface Power Line Conditioner Exhaust Fan Box SAT (Segmented Auto threshold) MMED Quest Direct link Direct SECS Full wafer inspection Tool can inspect the blank and pattern 8inch wafer, GRR<l0% (Fab 2139 PCCB spec). Defect Review System can review and classify the defects after inspection. All defects should be real defects and in the blue box. And tool should also has Clustering/Sampling/Sorting function. Stage and Chuck: 8 inch (200mm) low contact chuck Y stage using Stepper motor X stage using linear motor and X Slider with air bearing Theta and Z Stage using ECS Temperature: 20-25°C CDA: 80PSI Electricity: AC 208V / 3 phase/ Frequency S0Hz
    配置
    无配置
    OEM 型号描述
    The 2139 wafer inspection system offers sensitivity and productivity enhancements for IC manufacturers. It is available as an independent tool or as an upgrade to existing 2135 and 2138 tools, allowing manufacturers to extend the life of their current KLA-Tencor tools. The 2139 is based on KLA-Tencor’s proven image processing technology and includes features such as ultra-broadband illumination and Segmented Auto Threshold technology. It is also available with an integrated SMIF mini-environment.
    文件

    KLA

    2139

    verified-listing-icon

    已验证

    类别
    Defect Inspection

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    89679


    晶圆尺寸:

    8"/200mm


    年份:

    2001


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    KLA 2139

    KLA

    2139

    Defect Inspection
    年份: 2001状况: 二手
    上次验证60 多天前

    KLA

    2139

    verified-listing-icon
    已验证
    类别
    Defect Inspection
    上次验证: 60 多天前
    listing-photo-57b5b3557983413a9f45d8316bf8b4c5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74647/57b5b3557983413a9f45d8316bf8b4c5/cf7d2a0952514d0da7408c95ccad43f0_cdcecd0defeb4c47b2db72340808a0421201a_mw.jpeg
    listing-photo-57b5b3557983413a9f45d8316bf8b4c5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74647/57b5b3557983413a9f45d8316bf8b4c5/f84073c09c7e4eb1b9277cb12d771847_13b50f11b8684eee9e6cce2feef7acfe1201a_mw.jpeg
    listing-photo-57b5b3557983413a9f45d8316bf8b4c5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74647/57b5b3557983413a9f45d8316bf8b4c5/a566cc43bc02467880dc934de34ef39e_4a79581d04814612a6ffd558b39884fc1201a_mw.jpeg
    listing-photo-57b5b3557983413a9f45d8316bf8b4c5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74647/57b5b3557983413a9f45d8316bf8b4c5/4f29b615f2c94da08402242a268fd9c2_a2bbdf0aa87e4778b5319f30d34557601201a_mw.jpeg
    listing-photo-57b5b3557983413a9f45d8316bf8b4c5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74647/57b5b3557983413a9f45d8316bf8b4c5/c119c44ea68a48a78a9097007a8041b6_f77ccd1482c643ec8c12ecf045d9300e_mw.jpeg
    listing-photo-57b5b3557983413a9f45d8316bf8b4c5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74647/57b5b3557983413a9f45d8316bf8b4c5/3ce429e423774c52bb06764a7b1901ce_c2173856b0c34bb689c4dc77633495711201a_mw.jpeg
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    89679


    晶圆尺寸:

    8"/200mm


    年份:

    2001


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    KLA 2139-UI User Interface Console Inspection Station Diagnose Monitor Interface Power Line Conditioner Exhaust Fan Box SAT (Segmented Auto threshold) MMED Quest Direct link Direct SECS Full wafer inspection Tool can inspect the blank and pattern 8inch wafer, GRR<l0% (Fab 2139 PCCB spec). Defect Review System can review and classify the defects after inspection. All defects should be real defects and in the blue box. And tool should also has Clustering/Sampling/Sorting function. Stage and Chuck: 8 inch (200mm) low contact chuck Y stage using Stepper motor X stage using linear motor and X Slider with air bearing Theta and Z Stage using ECS Temperature: 20-25°C CDA: 80PSI Electricity: AC 208V / 3 phase/ Frequency S0Hz
    配置
    无配置
    OEM 型号描述
    The 2139 wafer inspection system offers sensitivity and productivity enhancements for IC manufacturers. It is available as an independent tool or as an upgrade to existing 2135 and 2138 tools, allowing manufacturers to extend the life of their current KLA-Tencor tools. The 2139 is based on KLA-Tencor’s proven image processing technology and includes features such as ultra-broadband illumination and Segmented Auto Threshold technology. It is also available with an integrated SMIF mini-environment.
    文件
    类似上架物品
    查看全部
    KLA 2139

    KLA

    2139

    Defect Inspection年份: 2001状况: 二手上次验证:60 多天前
    KLA 2139

    KLA

    2139

    Defect Inspection年份: 0状况: 二手上次验证:30 多天前
    KLA 2139

    KLA

    2139

    Defect Inspection年份: 0状况: 二手上次验证:60 多天前