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KLA 2139
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The 2139 wafer inspection system offers sensitivity and productivity enhancements for IC manufacturers. It is available as an independent tool or as an upgrade to existing 2135 and 2138 tools, allowing manufacturers to extend the life of their current KLA-Tencor tools. The 2139 is based on KLA-Tencor’s proven image processing technology and includes features such as ultra-broadband illumination and Segmented Auto Threshold technology. It is also available with an integrated SMIF mini-environment.
    文件

    无文件

    KLA

    2139

    verified-listing-icon

    已验证

    类别
    Defect Inspection

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Refurbished


    运行状况:

    未知


    产品编号:

    72999


    晶圆尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
    查看全部
    KLA 2139

    KLA

    2139

    Defect Inspection
    年份: 2001状况: 二手
    上次验证60 多天前

    KLA

    2139

    verified-listing-icon
    已验证
    类别
    Defect Inspection
    上次验证: 60 多天前
    listing-photo-5e9bf871c11f4a9d97713e2e0751c4b9-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Refurbished


    运行状况:

    未知


    产品编号:

    72999


    晶圆尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The 2139 wafer inspection system offers sensitivity and productivity enhancements for IC manufacturers. It is available as an independent tool or as an upgrade to existing 2135 and 2138 tools, allowing manufacturers to extend the life of their current KLA-Tencor tools. The 2139 is based on KLA-Tencor’s proven image processing technology and includes features such as ultra-broadband illumination and Segmented Auto Threshold technology. It is also available with an integrated SMIF mini-environment.
    文件

    无文件

    类似上架物品
    查看全部
    KLA 2139

    KLA

    2139

    Defect Inspection年份: 2001状况: 二手上次验证:60 多天前
    KLA 2139

    KLA

    2139

    Defect Inspection年份: 0状况: 二手上次验证:30 多天前
    KLA 2139

    KLA

    2139

    Defect Inspection年份: 0状况: 二手上次验证:60 多天前