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KLA AIT UV
    说明
    Damaged parts: 1.Robot-ABM407 2.Track motor
    配置
    -Asset HDD not included -HARD DRIVE WILL BE REFORMATTED. OPERATING SOFTWARE IS NOT INCLUDED. -Loading Configuration: FOUP -Number of Cassette/FOUP Positions: 2 -Software Version: 6.3.89.5 -Electrical Requirements: NA -Is System On-Line?: No -Off-Line Date (if applicable): 2019 -CE Mark Certified? : No -Date of Last PM: No -Date of Last Laser Change: NA -OEM Audit Available?: No -Can Produce Wafers AS IS?: No -Any Known Field Modifications?: No -All Cables Present?: NA System Configuration: -Main Platform: Fusion UV Key Common Options: -Clean Room Manuals: No -Standard Manuals: No -External Panels (Skins): Cleanroom White -Chuck Type: Universal Ceramic / Other -GEM/SECS Interface: Yes AIT LUV Series Options: -Hierarchical Load Adaptive Thresholding (HLAT): No -Auto-Positioning System: No -iADC Processor: No Internal Review – Optical Microscope: -Spot Optics (um): 3.5 um, 6 um External Support Equipment: -Laser Power Supply: Yes -Image Computer: Yes -Blower Box: Yes -Number of Blower Boxes: 1 -Chiller Make/Model: KLA PILLAR -The equipment include ISO loadport*2 & Wafer handler*1 & Inspection unit*1 & Line conditioner*1
    OEM 型号描述
    AIT UV™ is a high-throughput, high-sensitivity wafer inspection product that uses Dual AOD technology to increase scan rate, UV laser illumination for increased sensitivity, and advanced detection algorithms for improved defect capture. It also features real-time Adaptive Mode™ technology, three-channel double-darkfield optics, MultiSpot™ illumination, and Inline Automatic Defect Classification (iADC) for faster results. It is part of KLA-Tencor’s AIT family of inspection systems and is designed for 300-mm inspection and excursion monitoring at 100-nm design rules and below.
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    KLA

    AIT UV

    verified-listing-icon

    已验证

    类别

    Defect Inspection
    上次验证: 60 多天前
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    59107


    晶圆尺寸:

    12"/300mm


    年份:

    2008

    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
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    KLA

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    verified-listing-icon

    已验证

    类别

    Defect Inspection
    上次验证: 60 多天前
    listing-photo-e6bb989988c4462e8cb71098a49d9a63-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/e6bb989988c4462e8cb71098a49d9a63/2285b943d36a437bb5f5495a1d34e1f4_fa0952f7c82144cf9c9569b994c7ec0b_mw.jpeg
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    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    59107


    晶圆尺寸:

    12"/300mm


    年份:

    2008


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Damaged parts: 1.Robot-ABM407 2.Track motor
    配置
    -Asset HDD not included -HARD DRIVE WILL BE REFORMATTED. OPERATING SOFTWARE IS NOT INCLUDED. -Loading Configuration: FOUP -Number of Cassette/FOUP Positions: 2 -Software Version: 6.3.89.5 -Electrical Requirements: NA -Is System On-Line?: No -Off-Line Date (if applicable): 2019 -CE Mark Certified? : No -Date of Last PM: No -Date of Last Laser Change: NA -OEM Audit Available?: No -Can Produce Wafers AS IS?: No -Any Known Field Modifications?: No -All Cables Present?: NA System Configuration: -Main Platform: Fusion UV Key Common Options: -Clean Room Manuals: No -Standard Manuals: No -External Panels (Skins): Cleanroom White -Chuck Type: Universal Ceramic / Other -GEM/SECS Interface: Yes AIT LUV Series Options: -Hierarchical Load Adaptive Thresholding (HLAT): No -Auto-Positioning System: No -iADC Processor: No Internal Review – Optical Microscope: -Spot Optics (um): 3.5 um, 6 um External Support Equipment: -Laser Power Supply: Yes -Image Computer: Yes -Blower Box: Yes -Number of Blower Boxes: 1 -Chiller Make/Model: KLA PILLAR -The equipment include ISO loadport*2 & Wafer handler*1 & Inspection unit*1 & Line conditioner*1
    OEM 型号描述
    AIT UV™ is a high-throughput, high-sensitivity wafer inspection product that uses Dual AOD technology to increase scan rate, UV laser illumination for increased sensitivity, and advanced detection algorithms for improved defect capture. It also features real-time Adaptive Mode™ technology, three-channel double-darkfield optics, MultiSpot™ illumination, and Inline Automatic Defect Classification (iADC) for faster results. It is part of KLA-Tencor’s AIT family of inspection systems and is designed for 300-mm inspection and excursion monitoring at 100-nm design rules and below.
    文件

    无文件

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