说明
无说明配置
无配置OEM 型号描述
The AIT XP is a high-throughput scanning product for patterned wafer inspection that adjusts dynamically to all die regions, delivering maximum sensitivity and improved detection of killer defects. It features faster recipe setup, improved recipe robustness, and user-friendly setup templates. It enables improved cost of ownership and extends a fab’s inspection capability. The 23xx series, the AIT series, and the eS30 form part of a KLA-Tencor strategy that combines inspection technologies to offer fabs a new, customized strategy for capturing and controlling defects. KLA-Tencor delivers an overall defect-control solution through a comprehensive range of defect reduction and control technology.文件
无文件
KLA
AIT XP
类别
Defect Inspection
上次验证： 13 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
19241
晶圆尺寸：
8"/200mm
年份：
2003
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
The AIT XP is a high-throughput scanning product for patterned wafer inspection that adjusts dynamically to all die regions, delivering maximum sensitivity and improved detection of killer defects. It features faster recipe setup, improved recipe robustness, and user-friendly setup templates. It enables improved cost of ownership and extends a fab’s inspection capability. The 23xx series, the AIT series, and the eS30 form part of a KLA-Tencor strategy that combines inspection technologies to offer fabs a new, customized strategy for capturing and controlling defects. KLA-Tencor delivers an overall defect-control solution through a comprehensive range of defect reduction and control technology.文件
无文件