说明
Module: CFM配置
无配置OEM 型号描述
The AIT XUV is KLA-Tencor’s next-generation double-darkfield optical inspection tool. It offers higher throughput and sensitivity for 65-nm production requirements, with a wide range of spot sizes and advanced detection algorithms. It also features an auto-positioning system, autofocus unit, and iADC capability for faster results. It is field upgradeable from the AIT UV platform and provides detection capability for current-layer defects at speeds up to three times faster than the prior-generation AIT XP system, with improved focus, tracking performance, and die-to-die registration.文件
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KLA
AIT XUV
类别
Defect Inspection
上次验证： 9 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
136274
晶圆尺寸：
12"/300mm
年份：
2006
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available