说明
Copper only配置
450 MHz Computer (800Mhz to confirm) Win NT KLA Software 4.1 (New hardrive will be provided) JDSU 30 mw laser Normal (sensitivity 0.080Um) and Oblique (sensitivity 0.060 um) incidence SECS / GEM HSMS DIC XY coordinates Vacuum Handler Dual 300 FIMS Universal Load poarts 300 mm (2 of them) BlowerOEM 型号描述
The SP1 is an unpatterned surface inspection system that can be configured with KLA-Tencor’s Triple-Beam Illumination™ (TBI) technology for exceptional sensitivity on rough films. This technology adds an oblique illumination beam to the SP1’s standard optical configuration, enhancing its ability to capture and distinguish all variations of pits, including crystal originated pits (COPs), from particles. The TBI option maintains the SP1’s axi-symmetric design and allows the use of Adaptive Collection Optics for superior capture of defects on different substrate surfaces.文件
无文件
KLA
SP1-TBI
已验证
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
78031
晶圆尺寸：
8"/200mm, 12"/300mm
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
类似上架物品
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KLA
SP1-TBI
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
78031
晶圆尺寸：
8"/200mm, 12"/300mm
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Copper only配置
450 MHz Computer (800Mhz to confirm) Win NT KLA Software 4.1 (New hardrive will be provided) JDSU 30 mw laser Normal (sensitivity 0.080Um) and Oblique (sensitivity 0.060 um) incidence SECS / GEM HSMS DIC XY coordinates Vacuum Handler Dual 300 FIMS Universal Load poarts 300 mm (2 of them) BlowerOEM 型号描述
The SP1 is an unpatterned surface inspection system that can be configured with KLA-Tencor’s Triple-Beam Illumination™ (TBI) technology for exceptional sensitivity on rough films. This technology adds an oblique illumination beam to the SP1’s standard optical configuration, enhancing its ability to capture and distinguish all variations of pits, including crystal originated pits (COPs), from particles. The TBI option maintains the SP1’s axi-symmetric design and allows the use of Adaptive Collection Optics for superior capture of defects on different substrate surfaces.文件
无文件