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KLA 2430
    说明
    Macro Inspection
    配置
    无配置
    OEM 型号描述
    In 2001, we introduced the 2430 macro ADI series, which brought the benefits of the 2401's advanced analysis capabilities, high throughput and advanced detection algorithms to 300 mm production. Macro defects, which can ruin the entire wafer, are especially costly to chipmakers in 300 mm production, since more than twice the number of die are at risk with these larger wafers as compared to 200 mm wafers. The 2430 is the first automated macro ADI system on the market to be fully compliant with I300I standards for complete integration and rapid deployment in 300 mm fabs. Backside Wafer Inspection
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    KLA

    2430

    verified-listing-icon

    已验证

    类别

    Defect Inspection
    上次验证: 60 多天前
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    93993


    晶圆尺寸:

    12"/300mm


    年份:

    2004

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    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    类似上架物品
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    KLA 2430
    KLA2430Defect Inspection
    年份: 2004状况: 二手
    上次验证60 多天前

    KLA

    2430

    verified-listing-icon

    已验证

    类别

    Defect Inspection
    上次验证: 60 多天前
    listing-photo-287f951d76f248c1b2002d95ac629f21-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    93993


    晶圆尺寸:

    12"/300mm


    年份:

    2004


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Macro Inspection
    配置
    无配置
    OEM 型号描述
    In 2001, we introduced the 2430 macro ADI series, which brought the benefits of the 2401's advanced analysis capabilities, high throughput and advanced detection algorithms to 300 mm production. Macro defects, which can ruin the entire wafer, are especially costly to chipmakers in 300 mm production, since more than twice the number of die are at risk with these larger wafers as compared to 200 mm wafers. The 2430 is the first automated macro ADI system on the market to be fully compliant with I300I standards for complete integration and rapid deployment in 300 mm fabs. Backside Wafer Inspection
    文件

    无文件

    类似上架物品
    查看全部
    KLA 2430
    KLA
    2430
    Defect Inspection年份: 2004状况: 二手上次验证: 60 多天前
    KLA 2430
    KLA
    2430
    Defect Inspection年份: 2004状况: 二手上次验证: 30 多天前