说明
Wafer inspection system配置
Power requirements: 208 V 50/60 Hz CE markedOEM 型号描述
In October 2009, KLA launched the 8900 defect inspection system, a new tool for the CMOS Image Sensor market. The 8900 is designed to enable capture of a wide variety of defect types, with adjustable sensitivity and throughput settings for cost-effective defect management from initial product development through volume production of color filter arrays.文件
无文件
KLA
8900
类别
Defect Inspection
上次验证： 10 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
153416
晶圆尺寸：
8"/200mm, 12"/300mm
年份：
2011
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Wafer inspection system配置
Power requirements: 208 V 50/60 Hz CE markedOEM 型号描述
In October 2009, KLA launched the 8900 defect inspection system, a new tool for the CMOS Image Sensor market. The 8900 is designed to enable capture of a wide variety of defect types, with adjustable sensitivity and throughput settings for cost-effective defect management from initial product development through volume production of color filter arrays.文件
无文件