说明
No missing parts.配置
无配置OEM 型号描述
The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.文件
无文件
KLA
CANDELA CS1
已验证
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
47112
晶圆尺寸：
未知
年份：
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
CANDELA CS1
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
47112
晶圆尺寸：
未知
年份：
2007
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
No missing parts.配置
无配置OEM 型号描述
The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.文件
无文件