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KLA CANDELA CS1
    说明
    No missing parts.
    配置
    无配置
    OEM 型号描述
    The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.
    文件

    无文件

    类别
    Defect Inspection

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    47112


    晶圆尺寸:

    未知


    年份:

    2007


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    KLA

    CANDELA CS1

    verified-listing-icon
    已验证
    类别
    Defect Inspection
    上次验证: 60 多天前
    listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/c354f3ddbe164866b26dd1c340c29361_913b85810e0e44669381c054e7a872931105c_mw.jpeg
    listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/582d3e25e01f4da480322a76b22300e0_b930d6a8603d423b94a2699cce5273bc1201a_mw.jpeg
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    listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/80bb7dff47244bef82d6c5a5646115e7_0e1585aaf4f64ddd889092b9360c7f801105c_mw.jpeg
    listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/39d779b945fd40abaa16769e8f969bbd_a655698ffaea4c3aa88b203512e2f1861105c_mw.jpeg
    listing-photo-fc8bb10240f74327a1b54746d7daf959-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/41534/fc8bb10240f74327a1b54746d7daf959/cf2e72f51bfe43b79cb148822390c49f_4f6ddaba8d114c9c91acbf1432c8d1bf1105c_mw.jpeg
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    47112


    晶圆尺寸:

    未知


    年份:

    2007


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    No missing parts.
    配置
    无配置
    OEM 型号描述
    The new Candela CS1 and CS2 systems address compound semiconductor wafer inspection applications, providing the unique capability to inspect both transparent and opaque wafers for detection and classification of particles and other process-related defects.
    文件

    无文件