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说明
Wafer Handling System for a Leica INS 2000 Defect Review System No Microscope is Included Cassette to Cassette Wafer Handling for up to 200mm Wafers SMC Digital Pressure Sensor 120V/230V, 50/60 Hz, P Max 400 VA CE Marked配置
无配置OEM 型号描述
未提供文件
无文件
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
14788
晶圆尺寸：
8"/200mm
年份：
1996
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA / VISTEC / LEICA
INS2000
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
14788
晶圆尺寸：
8"/200mm
年份：
1996
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Wafer Handling System for a Leica INS 2000 Defect Review System No Microscope is Included Cassette to Cassette Wafer Handling for up to 200mm Wafers SMC Digital Pressure Sensor 120V/230V, 50/60 Hz, P Max 400 VA CE Marked配置
无配置OEM 型号描述
未提供文件
无文件