说明
无说明配置
无配置OEM 型号描述
The Optistation 7 IC Wafer Inspection System Dual, a 300mm fabrication compliant unit featuring a feeder arm transfer unit offering high throughput with a new macro illumination system allowing for thin film observation and defocus detection as well as detection of particulates and scratches on both front and backside.文件
无文件
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
125605
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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NIKON
OPTISTATION 7
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
125605
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
The Optistation 7 IC Wafer Inspection System Dual, a 300mm fabrication compliant unit featuring a feeder arm transfer unit offering high throughput with a new macro illumination system allowing for thin film observation and defocus detection as well as detection of particulates and scratches on both front and backside.文件
无文件