说明
无说明配置
Semi-Auto (Auto wafer handler),12" only. Specifications Wafer size: 300 mm (SEMI / M1.15 /t = 750 -20 um), Standard cassette types: FOUP, FOSB, and FFO Micro inspection: Surface, backside, edge, and macro image capture functions Wafer alignment: Non-contact alignment Wafer transfer system: High-speed, multi-axis robot Microscope: Nikon L300 300mm wafer inspection microscope (brightfield/darkfield and DIC observation) Expandability: 200mm wafer transfer, deformed wafer transfer, and thin wafer transfer Power usage: Power supply: 200 VAC -10%, max. 10A, 50/60 Hz Vacuum: -66.7 kPa/-30 NI/min Stage: Manual vacuum contact stage with 360° rotation System reliability: MTBF 1500 hours, Up time > 95%OEM 型号描述
OPTISTATION-3000 wafer inspection system.文件
NIKON
OPTISTATION-3000
已验证
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
66601
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
NIKON
OPTISTATION-3000
类别
Defect Inspection
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
66601
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available