
说明
Chroma 58221-200-2 Chroma 58173 LED Chip Level Tester配置
Chroma 58221-200-2 Chroma 58173 LED Chip Level TesterOEM 型号描述
The Chroma 58173, in automatic operation, comes with unique design and a whole new method for LED total power measurement. In bare wafer/chip LED test production, partial flux correction of total flux is the common measurement method in LED epitaxy industry. (See Figure 3 on flip page) However, conventional method causes some disadvantages, i.e., lower accuracy, low S/N ratio, and slow test time etc., and which are difficult to be applied on LED bar wafer/chip total power/flux test production.文件
无文件
PREFERRED
SELLER
CHROMA
58173
类别
Electronic Test
上次验证: 60 多天前
Buyer pays 12% premium of final sale price
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
103507
晶圆尺寸:
6"/150mm
年份:
2010
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Chroma 58221-200-2 Chroma 58173 LED Chip Level Tester配置
Chroma 58221-200-2 Chroma 58173 LED Chip Level TesterOEM 型号描述
The Chroma 58173, in automatic operation, comes with unique design and a whole new method for LED total power measurement. In bare wafer/chip LED test production, partial flux correction of total flux is the common measurement method in LED epitaxy industry. (See Figure 3 on flip page) However, conventional method causes some disadvantages, i.e., lower accuracy, low S/N ratio, and slow test time etc., and which are difficult to be applied on LED bar wafer/chip total power/flux test production.文件
无文件