说明
Includes Advantest KH 7 010436 & KH 7 010437 HIFX (Mother Boards) - HIFIX Type: SBC Type MB (Side-A & Side-B) - Compatible with M 6242 / M 6243 Handler配置
- Ampere Rating of Largest Motor: 14.4 A - Max Frequency: 2.256 GHz / 4.511 Gbps Accuracy: - OTA: +/- 60 ps [SBCAL] - Dr / Cp Skew: 46 ps p-p TH Channels: - DR Pin: 1344 ch - I/O Pin: 8046 ch - Term Pin: 8960 ch (in MB) - Level DR Pin: 896 ch - PPS ch: 1280 ch - DC ch: Additional DC : 1280 ch (448 ch LDC) - FC Channels: 84 DR + 504 I/O - Fail Memory: 1 Slice Board - Power Consumption: 82 kVA / System - 8 Power Lines - Cooling Water: 2 LinesOEM 型号描述
The ADVANTEST T5503HS is an advanced semiconductor testing system developed by Advantest Corporation. This system is specifically designed to offer comprehensive testing and verification of high-speed digital and mixed-signal semiconductor devices throughout the manufacturing process. Its sophisticated capabilities ensure precise and reliable testing, making it an essential tool for semiconductor manufacturers seeking top-level performance and quality assurance.文件
无文件
ADVANTEST
T5503HS
类别
Final Test
上次验证： 5 天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
147476
晶圆尺寸：
未知
年份：
2018
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Includes Advantest KH 7 010436 & KH 7 010437 HIFX (Mother Boards) - HIFIX Type: SBC Type MB (Side-A & Side-B) - Compatible with M 6242 / M 6243 Handler配置
- Ampere Rating of Largest Motor: 14.4 A - Max Frequency: 2.256 GHz / 4.511 Gbps Accuracy: - OTA: +/- 60 ps [SBCAL] - Dr / Cp Skew: 46 ps p-p TH Channels: - DR Pin: 1344 ch - I/O Pin: 8046 ch - Term Pin: 8960 ch (in MB) - Level DR Pin: 896 ch - PPS ch: 1280 ch - DC ch: Additional DC : 1280 ch (448 ch LDC) - FC Channels: 84 DR + 504 I/O - Fail Memory: 1 Slice Board - Power Consumption: 82 kVA / System - 8 Power Lines - Cooling Water: 2 LinesOEM 型号描述
The ADVANTEST T5503HS is an advanced semiconductor testing system developed by Advantest Corporation. This system is specifically designed to offer comprehensive testing and verification of high-speed digital and mixed-signal semiconductor devices throughout the manufacturing process. Its sophisticated capabilities ensure precise and reliable testing, making it an essential tool for semiconductor manufacturers seeking top-level performance and quality assurance.文件
无文件