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ADVANTEST T5833
  • ADVANTEST T5833
  • ADVANTEST T5833
  • ADVANTEST T5833
说明
无说明
配置
[PROPERTY) Version = 2.00 [SYSTEM INFORMATION) ProductType- T5833 PowerFrequency = 60 PStype THtype = OSTH MBtype - NORMAL SYS-Ctype = STANDARD RCPUcount = 0 EMfunction = STANDARD FmEcc = DISABLE FmHSFbmap = DISABLE
OEM 型号描述
The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.
文件

无文件

类别
Final Test

上次验证: 60 多天前

物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

102899


晶圆尺寸:

未知


年份:

2019


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

ADVANTEST

T5833

verified-listing-icon
已验证
类别
Final Test
上次验证: 60 多天前
listing-photo-060f832e41cb49d9bdd93985dc453cb2-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
物品主要详细信息

状况:

Used


运行状况:

未知


产品编号:

102899


晶圆尺寸:

未知


年份:

2019


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明
配置
[PROPERTY) Version = 2.00 [SYSTEM INFORMATION) ProductType- T5833 PowerFrequency = 60 PStype THtype = OSTH MBtype - NORMAL SYS-Ctype = STANDARD RCPUcount = 0 EMfunction = STANDARD FmEcc = DISABLE FmHSFbmap = DISABLE
OEM 型号描述
The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.
文件

无文件