说明
无说明配置
[PROPERTY) Version = 2.00 [SYSTEM INFORMATION) ProductType- T5833 PowerFrequency = 60 PStype THtype = OSTH MBtype - NORMAL SYS-Ctype = STANDARD RCPUcount = 0 EMfunction = STANDARD FmEcc = DISABLE FmHSFbmap = DISABLEOEM 型号描述
The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.文件
无文件
ADVANTEST
T5833
已验证
类别
Final Test
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
102899
晶圆尺寸：
未知
年份：
2019
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ADVANTEST
T5833
类别
Final Test
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
102899
晶圆尺寸：
未知
年份：
2019
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
[PROPERTY) Version = 2.00 [SYSTEM INFORMATION) ProductType- T5833 PowerFrequency = 60 PStype THtype = OSTH MBtype - NORMAL SYS-Ctype = STANDARD RCPUcount = 0 EMfunction = STANDARD FmEcc = DISABLE FmHSFbmap = DISABLEOEM 型号描述
The ADVANTEST T5833 is a cost-efficient, high-volume test solution capable of conducting wafer sort and final test for DRAM and NAND flash memory devices. With the increasing demand for faster and higher-capacity memory devices in mobile electronics, smart phones, tablets, internet, and cloud servers, chipmakers face challenges in testing a wide array of memory devices while maintaining high functionality and performance at a low cost of test (COT). The T5833 addresses these needs by offering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories, and next-generation non-volatile memory ICs.文件
无文件