说明
Memory Burn-in Tester B6700S配置
B6700S_01OEM 型号描述
B6700S system offers a dramatically lower-cost test solution for NAND flash memories while offering the same capabilities as its sister systems. The B6700S offers a unitized function of the B6700D and can be embedded within a multi-wafer probing system used in individual wafer-level testing, avoiding any costs associated with occupying floor space in lab or production environments.文件
无文件
ADVANTEST
B6700S
已验证
类别
Final Test
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
102494
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
ADVANTEST
B6700S
类别
Final Test
上次验证： 30 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
102494
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
Memory Burn-in Tester B6700S配置
B6700S_01OEM 型号描述
B6700S system offers a dramatically lower-cost test solution for NAND flash memories while offering the same capabilities as its sister systems. The B6700S offers a unitized function of the B6700D and can be embedded within a multi-wafer probing system used in individual wafer-level testing, avoiding any costs associated with occupying floor space in lab or production environments.文件
无文件