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说明
无说明配置
无配置OEM 型号描述
Advantest’s new T2000 AiR offers broad test coverage for these diverse modules and system-in- package (SiP) devices. With its modular architecture providing maximum flexibility, the tester can be configured with up to six discrete air-cooled measurement modules. This enables single-system test coverage for a wide array of highly integrated, multi-functional devices. Designed to perform digital functions and SCAN testing over as many as 512 channels in parallel, the system can test high-voltage devices up to 2,000 volts, high-precision DC converters, automotive DC devices, mixed-signal ICs with bandwidths up to 100 MHz, RF communication chips and CMOS image sensors.文件
无文件
ADVANTEST
T2000 AiR
类别
Final Test
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
112652
晶圆尺寸：
未知
年份：
未知
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Refurbishment Services
Available
说明
无说明配置
无配置OEM 型号描述
Advantest’s new T2000 AiR offers broad test coverage for these diverse modules and system-in- package (SiP) devices. With its modular architecture providing maximum flexibility, the tester can be configured with up to six discrete air-cooled measurement modules. This enables single-system test coverage for a wide array of highly integrated, multi-functional devices. Designed to perform digital functions and SCAN testing over as many as 512 channels in parallel, the system can test high-voltage devices up to 2,000 volts, high-precision DC converters, automotive DC devices, mixed-signal ICs with bandwidths up to 100 MHz, RF communication chips and CMOS image sensors.文件
无文件