说明
无说明配置
4 x DPIN96 (96 Channel, 100MHz, Digital Instrument w/16M Vector Memory) 1 x DMSDIG (4 Channel Audio-Video Digitizer) 1 x DMSAWG (8 Channel Audio-Video Arbitrary Waveform Generator) 1 x DIBU (DIB Utility Instrument) 1 x Pegasus Manipulator 1 x Computer Operating System: Linux Software: DMD V2.1.1.4OEM 型号描述
The LTX-Credence Diamond 10 is a versatile and cost-effective test system designed for testing a wide variety of consumer and industrial integrated circuit (IC) devices. It is particularly well-suited for cost-sensitive environments where efficiency is crucial. The Diamond 10's compact size and low power consumption make it a practical choice for both laboratory and cleanroom settings, providing a flexible and efficient solution for IC testing needs.文件
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COHU / LTX-CREDENCE
DIAMOND 10
已验证
类别
Final Test
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
101163
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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COHU / LTX-CREDENCE
DIAMOND 10
类别
Final Test
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
101163
晶圆尺寸：
未知
年份：
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
4 x DPIN96 (96 Channel, 100MHz, Digital Instrument w/16M Vector Memory) 1 x DMSDIG (4 Channel Audio-Video Digitizer) 1 x DMSAWG (8 Channel Audio-Video Arbitrary Waveform Generator) 1 x DIBU (DIB Utility Instrument) 1 x Pegasus Manipulator 1 x Computer Operating System: Linux Software: DMD V2.1.1.4OEM 型号描述
The LTX-Credence Diamond 10 is a versatile and cost-effective test system designed for testing a wide variety of consumer and industrial integrated circuit (IC) devices. It is particularly well-suited for cost-sensitive environments where efficiency is crucial. The Diamond 10's compact size and low power consumption make it a practical choice for both laboratory and cleanroom settings, providing a flexible and efficient solution for IC testing needs.文件
无文件