We value your privacy
We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. 阅读更多
说明
无说明配置
CREDENCE SAPPHIRE TESTER - Configuration: // Configuring Credence_TestHeadIf in slot[0] // Configuring NPTest_6AmpDPS in slot[1] // Configuring NPTest_6AmpDPS in slot[2] // Configuring NPTest_6AmpDPS in slot[37] // Configuring NPTest_D4064PS in slot[6] // Configuring NPTest_D4064PS in slot[7] // Configuring NPTest_D4064PS in slot[31] // Configuring NPTest_QBIX in slot[16] // Configuring NPTest_QBIX in slot[23] + calibration kit Credence SAPPHIRE Spare Instruments: 12 Cartes D4064 (64 channels digitaux 400MBs) P/N 9615-2147 1 Carte QBIX (Analog cards 4 channels) P/N 9615-2007 2 Cartes D3208 (8 channels digitaux 3.2 Gbs) P/N 9615-2158 4 Cartes DPS (Power Supply) P/N 9615-2005 1 Carte THIF (Test Head interface) P/N 9615-2014 18 Module 48V P/N 122_1257-00 6 Module 24V P/N 001-4062-0007OEM 型号描述
Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.文件
无文件
类别
Final Test
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
73441
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
类似上架物品
查看全部
COHU / LTX-CREDENCE
SAPPHIRE
类别
Final Test
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
73441
晶圆尺寸：
未知
年份：
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
CREDENCE SAPPHIRE TESTER - Configuration: // Configuring Credence_TestHeadIf in slot[0] // Configuring NPTest_6AmpDPS in slot[1] // Configuring NPTest_6AmpDPS in slot[2] // Configuring NPTest_6AmpDPS in slot[37] // Configuring NPTest_D4064PS in slot[6] // Configuring NPTest_D4064PS in slot[7] // Configuring NPTest_D4064PS in slot[31] // Configuring NPTest_QBIX in slot[16] // Configuring NPTest_QBIX in slot[23] + calibration kit Credence SAPPHIRE Spare Instruments: 12 Cartes D4064 (64 channels digitaux 400MBs) P/N 9615-2147 1 Carte QBIX (Analog cards 4 channels) P/N 9615-2007 2 Cartes D3208 (8 channels digitaux 3.2 Gbs) P/N 9615-2158 4 Cartes DPS (Power Supply) P/N 9615-2005 1 Carte THIF (Test Head interface) P/N 9615-2014 18 Module 48V P/N 122_1257-00 6 Module 24V P/N 001-4062-0007OEM 型号描述
Sapphire is our next generation high performance SoC configurable test platform. First shipped by NPTest in December 2003, it is designed to be a highly reconfigurable and scalable functional and structural tester for a wide range of ICs. All of Sapphire’s test electronics are integrated in the test head and interconnected by a proprietary high bandwidth bus, which results in a lower cost platform and a smaller footprint. Sapphire can be used for design debug and validation, characterization, wafer sort and final test. The design supports a broad configuration range of up to 5,000 pins and a performance envelope that ranges from 200 MHz to 6.4 GHz.文件
无文件