跳至主要内容
We value your privacy

We and our selected partners use cookies to enhance your browsing experience, serve personalized content, and analyze our traffic. By clicking "Accept All", you consent to our use of cookies. 阅读更多

Moov logo

Moov Icon
TERADYNE / EAGLE ETS-200T
  • TERADYNE / EAGLE ETS-200T
  • TERADYNE / EAGLE ETS-200T
  • TERADYNE / EAGLE ETS-200T
说明
无说明
配置
Qty TMUX ASM2625 1 LIB ASM1508 1 ASM0817 1 THIB ASM3178 1 MCS ASM3236 1 PMU ASM1808 1 MCM-DDS ASM3161 1 ISOCOM ASM3066 1 HPU ASM1540 1 HPUBST ASM1539 1 SPU-500 ASM1543 1 SPU-100 ASM1544 1
OEM 型号描述
The ETS-200T discrete test platform is built on proven ETS technology and provides true index-parallel testing specifically for turret and rotary handlers. These test systems maximize throughput with pattern-based test techniques based on Eagle SmartPin™ technology coupled with the use of dynamic Cbits for enhanced user control. The ETS-200T provides a complete test solution from wafer sort to final test for MOSFETs, including integrated control and datalogging for UIL, dVSD, Qg and LCR meter.
文件

无文件

类别
Final Test

上次验证: 60 多天前

物品主要详细信息

状况:

Used


运行状况:

Installed / Idle


产品编号:

124801


晶圆尺寸:

未知


年份:

未知


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

TERADYNE / EAGLE

ETS-200T

verified-listing-icon
已验证
类别
Final Test
上次验证: 60 多天前
listing-photo-0854d5bf658e4f7b9c9fb762ee9a04c2-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
物品主要详细信息

状况:

Used


运行状况:

Installed / Idle


产品编号:

124801


晶圆尺寸:

未知


年份:

未知


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明
配置
Qty TMUX ASM2625 1 LIB ASM1508 1 ASM0817 1 THIB ASM3178 1 MCS ASM3236 1 PMU ASM1808 1 MCM-DDS ASM3161 1 ISOCOM ASM3066 1 HPU ASM1540 1 HPUBST ASM1539 1 SPU-500 ASM1543 1 SPU-100 ASM1544 1
OEM 型号描述
The ETS-200T discrete test platform is built on proven ETS technology and provides true index-parallel testing specifically for turret and rotary handlers. These test systems maximize throughput with pattern-based test techniques based on Eagle SmartPin™ technology coupled with the use of dynamic Cbits for enhanced user control. The ETS-200T provides a complete test solution from wafer sort to final test for MOSFETs, including integrated control and datalogging for UIL, dVSD, Qg and LCR meter.
文件

无文件