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TERADYNE J750HD
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The J750 HD Probe Tower is an advanced piece of technology designed to keep up with the latest J750 EX and IP750 instrumentation, such as the HOVIS, ICUL, LCD, and future instruments. It increases the physical spring pin count of the standard J750 1024 Pin Tower while providing the same improved electrical performance as the J750 EX Tower. With a total pin count of 5848, compared to the 2992 pins of the standard tower, it represents a 95% increase. This expanded pin count enables multisite testing, allowing for more system resources to be connected to more DUTs. The HD tower retains the same mechanical outlines as the standard prober and uses the same J750 1024 probe card form factor, providing docking interface compatibility. Based on proven spring pin technology, this 300mm probe tower offers unmatched reliability, uptime, and flexibility. It’s an impressive piece of technology that is sure to improve testing capabilities.
    文件

    无文件

    类别
    Final Test

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    106102


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    TERADYNE

    J750HD

    verified-listing-icon
    已验证
    类别
    Final Test
    上次验证: 60 多天前
    listing-photo-101a3b5b79ae4052bba6775e996daf65-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    106102


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    无配置
    OEM 型号描述
    The J750 HD Probe Tower is an advanced piece of technology designed to keep up with the latest J750 EX and IP750 instrumentation, such as the HOVIS, ICUL, LCD, and future instruments. It increases the physical spring pin count of the standard J750 1024 Pin Tower while providing the same improved electrical performance as the J750 EX Tower. With a total pin count of 5848, compared to the 2992 pins of the standard tower, it represents a 95% increase. This expanded pin count enables multisite testing, allowing for more system resources to be connected to more DUTs. The HD tower retains the same mechanical outlines as the standard prober and uses the same J750 1024 probe card form factor, providing docking interface compatibility. Based on proven spring pin technology, this 300mm probe tower offers unmatched reliability, uptime, and flexibility. It’s an impressive piece of technology that is sure to improve testing capabilities.
    文件

    无文件