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TERADYNE IP750EP
    说明
    Tester
    配置
    无配置
    OEM 型号描述
    The IP750EP is a powerful digital test system designed for the testing needs of CCD/CMOS image sensor devices. It features a 100 MHz digital test capability and supports CCD devices exceeding 10 Megapixels, as well as the digitized pixel capture function required of CMOS image sensors. With high-speed, multisite parallel testing capability up to 16 in parallel, the IP750EP helps to reduce test costs. The system also features IG-XL software, which combines the performance of the latest PC technology and Windows operating system with familiar Microsoft Windows® productivity tools (Microsoft Excel® and Visual Basic) to speed up program development. Overall, the IP750EP is a versatile and efficient solution for testing CCD/CMOS image sensor devices.
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    TERADYNE

    IP750EP

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    已验证

    类别
    Final Test

    上次验证: 60 多天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    72196


    晶圆尺寸:

    未知


    年份:

    未知

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    Logistics Support
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    Money Back Guarantee
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    Transaction Insured by Moov
    Available
    Refurbishment Services
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    类似上架物品
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    TERADYNE IP750EP

    TERADYNE

    IP750EP

    Final Test
    年份: 0状况: 二手
    上次验证60 多天前

    TERADYNE

    IP750EP

    verified-listing-icon
    已验证
    类别
    Final Test
    上次验证: 60 多天前
    listing-photo-d812e51cc0f146a4aee51e8edc7b487f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    72196


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    Tester
    配置
    无配置
    OEM 型号描述
    The IP750EP is a powerful digital test system designed for the testing needs of CCD/CMOS image sensor devices. It features a 100 MHz digital test capability and supports CCD devices exceeding 10 Megapixels, as well as the digitized pixel capture function required of CMOS image sensors. With high-speed, multisite parallel testing capability up to 16 in parallel, the IP750EP helps to reduce test costs. The system also features IG-XL software, which combines the performance of the latest PC technology and Windows operating system with familiar Microsoft Windows® productivity tools (Microsoft Excel® and Visual Basic) to speed up program development. Overall, the IP750EP is a versatile and efficient solution for testing CCD/CMOS image sensor devices.
    文件

    无文件

    类似上架物品
    查看全部
    TERADYNE IP750EP

    TERADYNE

    IP750EP

    Final Test年份: 0状况: 二手上次验证: 60 多天前
    TERADYNE IP750EP

    TERADYNE

    IP750EP

    Final Test年份: 2002状况: 二手上次验证: 60 多天前
    TERADYNE IP750EP

    TERADYNE

    IP750EP

    Final Test年份: 2002状况: 二手上次验证: 60 多天前