说明
无说明配置
8 PE + 2 DPSOEM 型号描述
The J750 Family of semiconductor test systems by Teradyne is a compact and economical solution that delivers high-efficiency parallel test in a small system footprint. The J750 Family is available in 512 pin, 1024 pin, and J750k configurations, each with its own set of features and capabilities. The 512 pin and 1024 pin configurations both have a clock speed of 100 MHz, while the J750k has a clock speed of 66 MHz / 33 MHz. All configurations come with IG-XL software built on Windows and Microsoft Excel, and offer various options for memory test, converter test, mixed signal test, RFID, scan, APMU channels, high voltage drivers, and device power supplies.文件
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TERADYNE
J750
已验证
类别
Final Test
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
113961
晶圆尺寸：
未知
年份：
2010
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
类似上架物品
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TERADYNE
J750
类别
Final Test
上次验证： 60 多天前
物品主要详细信息
状况：
Used
运行状况:
未知
产品编号：
113961
晶圆尺寸：
未知
年份：
2010
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
8 PE + 2 DPSOEM 型号描述
The J750 Family of semiconductor test systems by Teradyne is a compact and economical solution that delivers high-efficiency parallel test in a small system footprint. The J750 Family is available in 512 pin, 1024 pin, and J750k configurations, each with its own set of features and capabilities. The 512 pin and 1024 pin configurations both have a clock speed of 100 MHz, while the J750k has a clock speed of 66 MHz / 33 MHz. All configurations come with IG-XL software built on Windows and Microsoft Excel, and offer various options for memory test, converter test, mixed signal test, RFID, scan, APMU channels, high voltage drivers, and device power supplies.文件
无文件