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TERADYNE J750EX-HD
    说明
    TESTER
    配置
    无配置
    OEM 型号描述
    The J750Ex-HD offers the lowest cost test solution for uncompromised test quality of less complex mixed signal devices. The J750Ex-HD is well-known for its ‘zero footprint’ design minimizing use of valuable manufacturing floor space. The scalability of the test system, to 2048 multifunction pins and data rates up 400 MHz/800 Mbps, makes it ideal for low-cost devices with increasing feature integration.
    文件

    无文件

    类别
    Final Test

    上次验证: 17 天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    129256


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    TERADYNE

    J750EX-HD

    verified-listing-icon
    已验证
    类别
    Final Test
    上次验证: 17 天前
    listing-photo-d039f50aa0de469e81b5714f52470735-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    129256


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    TESTER
    配置
    无配置
    OEM 型号描述
    The J750Ex-HD offers the lowest cost test solution for uncompromised test quality of less complex mixed signal devices. The J750Ex-HD is well-known for its ‘zero footprint’ design minimizing use of valuable manufacturing floor space. The scalability of the test system, to 2048 multifunction pins and data rates up 400 MHz/800 Mbps, makes it ideal for low-cost devices with increasing feature integration.
    文件

    无文件