
说明
无说明配置
microFLEX tester base IPD/OPD docking z800 work station 12 slots enabled MP936 manipulator 2 x DC30 1 x VHFAC 2 x HSD200 2 x BBAC 4 x 3MHz BBAC SRC lic IN-150-03 4 x 3MHX BBAC CAP lic IN-151-03 2 x HSD 50MHZ lic IN-140-05 2 x HSD 4MB lic IN-122-04 2 x HSD DSSC lic IN-124-00 2 x VHF SRC lic IN-160-15 2 x VHF CAP lic IN-161-03OEM 型号描述
The microFLEX test system is a smaller version of the FLEX test system, with a zero-footprint “tester in a test head” design. It is well-suited for consumer, wireless, and automotive device testing, and its small size makes it ideal for installations with limited floor space. The microFLEX system offers cost-efficient testing up to 200 MHz and is ideal for analog, digital, and mixed-signal System-on-a-Chip (SoC) and System-in-Package (SiP) device testing applications. It has a broad range of instruments to choose from and offers instrument and DIB compatibility with the FLEX test system. The system’s smaller air-cooled test head has 12 universal slots to accommodate a range of instruments and can easily be reconfigured for different test strategies. An optional small-footprint 19” rack cabinet accommodates third-party instruments, such as those used in microwave test applications. The small footprint of the microFLEX system saves floor space as system resources such as the power distribution unit, test computer, and clock reference are located in the test head itself, eliminating the need for a separate mainframe cabinet.文件
无文件
类似上架物品
查看全部PREFERRED
SELLER
TERADYNE
microFLEX
类别
Final Test
上次验证: 60 多天前
Buyer pays 12% premium of final sale price
物品主要详细信息
状况:
Used
运行状况:
未知
产品编号:
58052
晶圆尺寸:
未知
年份:
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
说明
无说明配置
microFLEX tester base IPD/OPD docking z800 work station 12 slots enabled MP936 manipulator 2 x DC30 1 x VHFAC 2 x HSD200 2 x BBAC 4 x 3MHz BBAC SRC lic IN-150-03 4 x 3MHX BBAC CAP lic IN-151-03 2 x HSD 50MHZ lic IN-140-05 2 x HSD 4MB lic IN-122-04 2 x HSD DSSC lic IN-124-00 2 x VHF SRC lic IN-160-15 2 x VHF CAP lic IN-161-03OEM 型号描述
The microFLEX test system is a smaller version of the FLEX test system, with a zero-footprint “tester in a test head” design. It is well-suited for consumer, wireless, and automotive device testing, and its small size makes it ideal for installations with limited floor space. The microFLEX system offers cost-efficient testing up to 200 MHz and is ideal for analog, digital, and mixed-signal System-on-a-Chip (SoC) and System-in-Package (SiP) device testing applications. It has a broad range of instruments to choose from and offers instrument and DIB compatibility with the FLEX test system. The system’s smaller air-cooled test head has 12 universal slots to accommodate a range of instruments and can easily be reconfigured for different test strategies. An optional small-footprint 19” rack cabinet accommodates third-party instruments, such as those used in microwave test applications. The small footprint of the microFLEX system saves floor space as system resources such as the power distribution unit, test computer, and clock reference are located in the test head itself, eliminating the need for a separate mainframe cabinet.文件
无文件