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TERADYNE UFLEX-SC
    说明
    无说明
    配置
    UFlex HD Tester Spec: UP1600+ *2 UVI80*1 Zeta RF (2/1) *1 Tera1 workstation Without license
    OEM 型号描述
    UltraFLEX-SC is an optimized test system designed for testing high-performance digital and system-on-a-chip (SoC) devices. It provides the functionality and accuracy required to test complex SoC devices designed for mobile applications, networking, storage, and high-end use. With its 24 slot test system, UltraFLEX-SC is the perfect choice for devices that require high throughput, high-speed signals, precision signals, wide test coverage, and highly parallel test.
    文件

    无文件

    类别
    Final Test

    上次验证: 5 天前

    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    82734


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    TERADYNE

    UFLEX-SC

    verified-listing-icon
    已验证
    类别
    Final Test
    上次验证: 5 天前
    listing-photo-b0c2213185ae40b0a0f4c3b0abc0d4d7-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    物品主要详细信息

    状况:

    Used


    运行状况:

    未知


    产品编号:

    82734


    晶圆尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    说明
    无说明
    配置
    UFlex HD Tester Spec: UP1600+ *2 UVI80*1 Zeta RF (2/1) *1 Tera1 workstation Without license
    OEM 型号描述
    UltraFLEX-SC is an optimized test system designed for testing high-performance digital and system-on-a-chip (SoC) devices. It provides the functionality and accuracy required to test complex SoC devices designed for mobile applications, networking, storage, and high-end use. With its 24 slot test system, UltraFLEX-SC is the perfect choice for devices that require high throughput, high-speed signals, precision signals, wide test coverage, and highly parallel test.
    文件

    无文件